MIL-PRF-55514F, PERFORMANCE SPECIFICATION, CAPACITORS, FIXED, PLASTIC (OR METALLIZED PLASTIC) DIELECTRIC, DC OR DC-AC, IN NONMETAL CASES, NON-ESTABLISHED AND ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR (15 DEC 2005)., This specification covers the general requirements for established reliability (ER) and non-established reliability (non-ER), (product level C), plastic (or metallized plastic) dielectric, fixed capacitors, enclosed in nonmetal cases intended primarily, in view of the limited long term moisture resistant characteristics, for use in potted or encapsulated systems, in blocking, filter, and by-pass applications (see 6.4). ER capacitors covered by this specification have failure rate levels (M, P, R, and S) ranging from 1.0 percent to 0.001 percent per 1,000 hours. These failure rates (FR) are established at a 90-percent confidence level and maintained at a 10-percent producer’s risk and based on life tests performed at +85°C or +105°C, whichever is applicable. An acceleration factor of 5:1 has been used to relate life test data obtained at 125 percent, or 140 percent of rated voltage at +85°C or +105°C, whichever is applicable, to rated voltage at +85°C or +105°C, whichever is applicable. The product levels are based on catastrophic failures and failures occurring outside the degradation limits.【英文标准名称】:TestMethodforMeasurementofInsulatorThicknessandRefractiveIndexonSiliconSubstratesbyEllipsometry
【原文标准名称】:椭圆法测量硅衬底上绝缘层厚度及折射率的试验方法
【标准号】:ASTMF576-1995
【标准状态】:作废
【国别】:美国
【发布日期】:1995
【实施或试行日期】:
【发布单位】:美国材料与试验协会(ASTM)
【起草单位】:ASTM
【标准类型】:()
【标准水平】:()
【中文主题词】:硅;衬底(绝缘);电子工程;矽;折射率;绝缘子;厚度;测量
【英文主题词】:measurement;electronicengineering;insulators;refractiveindex;substrates(insulating);thickness;silicon
【摘要】:
【中国标准分类号】:H80
【国际标准分类号】:29_040_30
【页数】:
【正文语种】:英语